Friday, December 8, 2017

Embedded Control-Record Layouts Improve Database and RFID Sensor Testing

Embedded Control-Record Layouts Improve Database and RFID Sensor Testing

Software application designers and hardware application developers are working as teams to incorporate control-record layouts into end-to-end XML services for RFID networks.  Using these newly formed XML tag sets made up of customized control-records has improved the design and development scenarios across diverse hardware platforms, operating systems, applications, and databases.

As software application developers begin to build RFID-and-sensor networks within key growth areas, it has become common place to witness recent deployments of control-record structures embedded in sensors and their supporting software. These control records contribute immensely to the major functions of any RFID sensor application including inputs, data-lookup and storage, interface programming and outputs.  

These five major features are now incorporated into the application as a new and more efficient XML and database schema. This improved configuration has proven to meet growing demands to test multi-vendor RFID and sensor products for their ability to withstand extreme conditions.  These conditions include excessive heat and cold, shock, humidity, vibration, altitude, pressure and all are reliably monitored using the new control-record layout approach.

The key design feature in the programming arrangement described in this article is the idea that an intermediate control record receives and distributes signals to and from the software and hardware sides of the full application. This nicely integrates selected signals from both spheres of operation and allows an interface to adapt dynamically to different device types. As new devices are attached and configured with the application, no appreciable interference is noticed in the originally attached devices.

Because the embedded layout of many types of devices can be addressed through the use of control records, new applications are provided with better XML testing languages. Additionally, this feature provides designers with the opportunity to introduce database simulators for a more accurate and dynamic portrayal of RFID and Sensor operation.  This dynamic portrayal is added to the accumulated testing history and a better picture of performance emerges.

As RFID becomes more widely deployed, network reliability, security, and data integrity become increasingly critical. And for most companies, the task of ensuring those three things will be overwhelming and complex, especially across multiple hardware platforms and configurations and diverse supplier and partner networks and databases.

But because it is now feasible to virtually attach these control-record layouts to alleviate some of the major complexities associated with the required tests, any company can develop new products that may have been prohibitive in the past.

Tom Gruich is a professional database designer with 40 years experience in systems analysis and design of database software applications. For more database business mapping thoughts and design ideas please visit Database Mapping or his Smart Database website at =>

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